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About the Authors
Stephen Beeby is a senior research fellow in the School of Electronics and Computer
Science at the University of Southampton, United Kingdom. He holds a B.Eng.
(Hons.) in mechanical engineering from the University of Portsmouth, United King-
dom, and a Ph.D. in mechanical engineering from the University of Southampton.
Graham Ensell is a senior research fellow in the School of Electronics and Computer
Science at the University of Southampton. He received a B.Sc. in physics from Impe-
rial College at the University of London and a Ph.D. in medical physics from the
Royal Free Hospital School of Medicine at the University of London.
Michael Kraft is a lecturer in the School of Electronics and Computer Science at the
University of Southampton. He holds a Dipl.-Ing. in electronics from Alexander von
Humboldt University in Erlangen, Germany, and a Ph.D. in electronics and control
from Coventry University in Coventry, United Kingdom.
Neil White is a professor of intelligent sensor systems in the School of Electronics
and Computer Science at the University of Southampton. A Fellow of the Institution
of Electrical Engineers (IEE) and the Institute of Physics (IOP), as well as a Senior
Member of the IEEE, he earned a Ph.D. in sensors at the University of Southampton
and has been a full-time member of its academic staff since 1990. Professor White
has researched extensively in the area of sensor technology and materials, and his
work has been published in refereed journals and textbooks and has been presented
at international conferences.
Contributing Authors
Barry Jones is an experienced teacher, practitioner, and researcher in the fields
of measurement, sensors, transducers and actuators, instrumentation, metrology,
automatic inspection, condition monitoring and preventative maintenance, and
nondestructive testing and evaluation. He is the author and editor of five books and
has published more than 280 papers and articles. Since 1986, he has been a profes-
sor of manufacturing metrology at Brunel University, in West London, England,
and the director of the Brunel Centre for Manufacturing Metrology. He received a
D.Sc. from the University of Manchester in 1985 and the Dr. Honoris Causa from
the Technical University of Sofia in 2001, and holds fellowships of five professional
bodies. He received a 1995 Metrology for World Class Manufacturing Award.
Christian G. J. Schabmueller received his first degree in microsystems technology
from the University of Applied Sciences, Regensburg, Germany. During his studies
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