Page 391 - A Practical Guide from Design Planning to Manufacturing
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Glossary  361

        Cell-based design (CBD)  A partial automated design method for creating
        layout by using a library of predesigned cells.
        Ceramic dual in-line package (CERDIP)  A ceramic package with rows of leads
        on two sides.
        Chemical mechanical planarization (CMP)  A manufacturing process to create
        a flat surface for the next processing step by spinning the wafer in an abrasive
        slurry.
        Chemical vapor deposition (CVD)  Deposition of material through the chem-
        ical reaction of gases.
        Chip on board (COB)  Attaching a bare integrated circuit die directly to a
        printed circuit board. Also called direct chip attach (DCA).
        Chip scale package (CSP)  An integrated circuit package with area less than
        1.5 times the die area.
        Chipset  A pair of chips responsible for communication between the processor
        and other components on the motherboard. Typically one chip of the chipset is
        responsible for communication with high-speed components and the other with
        lower-speed components.
        Circuit design  The design step of changing logic (usually written into RTL)
        into a transistor implementation.
        Circuit marginality  A design problem that only appears at certain combinations
        of voltage, temperature, and frequency.
        CISC   Complex instruction set computing.
        Cleanroom   An integrated circuit fabrication facility where particles in the air
        are carefully controlled to limit manufacturing defects. The class of cleanroom
        is measured by the average number of particles above 0.5 µm in diameter per
        cubic foot of air.
        Clock jitter  Variation in clock frequency, causing some clock cycles to be longer
        or shorter than others.
        Clock skew  Variation in the arrival of a single clock edge at different points
        on the die, causing some sequentials to receive the clock signal before others.
        CMOS    Complementary metal oxide semiconductor.
        CMP   Chemical mechanical planarization.
        COB   Chip on board.
        Coefficient of thermal expansion (CTE)  The rate at which a material expands
        when heated. When assembling die into a package or packages onto a board it
        is important to try and minimize differences in CTE in order to limit the mechan-
        ical stress caused by heating.
        Cold miss  A cache miss caused by a memory address being accessed for the
        first time.
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