Page 395 - A Practical Guide from Design Planning to Manufacturing
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Glossary  365

        Etch selectivity  The ratio of etch rates between the layer to be removed and
        the material beneath it.
        Etching  Physical and chemical means of removing a material layer.
        E-test  Electrical test.
        EUV   Extreme ultraviolet.
        Exception  A redirection of program flow caused by an unusual event during
        the execution of an instruction that would not normally alter the control flow.
        An example is redirection of the program to an error handling routine upon a
        division by zero.
        Explicitly parallel instruction computing (EPIC)  A computer architecture
        designed to allow more instructions per cycle by encoding the instructions with
        information showing which can be executed in parallel. The architecture used
        by the Itanium family of processors.
        Extended precision  A binary floating-point number format using 80 bits.
        External lead  The part of a package lead outside the die encapsulation.
        Extreme ultraviolet (EUV) lithography  Photolithography using wavelengths
        as short as 13.5 nm.
        Fanout  The ratio between the total capacitive load being driven by a gate and
        the capacitance of one of that gate’s inputs. The higher the fanout of a gate, the
        larger its delay.
        Fault exception  An exception that after being called retries the instruction that
        caused the exception.
        Fault model  The type of defect being assumed during automatic test pattern
        generation. The most common fault model is the stuck-at model, which assumes
        inputs of each gate may be permanently fixed at high or low voltages.
        FC   Flip-chip.
        FF   Flip-flop.
        FIB  Focused ion beam.
        Field programmable gate array (FPGA)  An integrated circuit designed as an
        array of generic logic gates and programmable storage sequentials, which allows
        the logic function being performed to be dynamically reconfigured. In processor
        design, FPGAs are commonly used to allow high-speed simulation of designs
        before they are fabricated.
        FireWire  A peripheral bus standard common among digital video cameras
        and recorders. Also called IEEE 1394.
        First silicon  The arrival of the first finished chips of a new integrated circuit
        design.
        Flame retardant material type 4 (FR4)  A fiberglass material commonly used
        to make printed circuit boards.
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