Page 393 - A Practical Guide from Design Planning to Manufacturing
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Glossary  363

        Damascene   A process for creating interconnects by first etching trenches into
        a layer of insulation and then filling them with a conducting material. Commonly
        used for copper interconnects on integrated circuits.
        Data dependency  A dependency between instructions using the same regis-
        ters or memory locations. True data dependencies are caused by one instruction
        using the result of another, a read-after-write dependency. False data depend-
        encies are caused by instructions waiting to write to locations being used by other
        instructions, write-after-read or write-after-write dependencies.
        DCA   Direct chip attach.
        Deadlock  When forward progress cannot be made in a program because mul-
        tiple instructions are waiting for each other to complete.
        Decoupling capacitors (Decaps)  Capacitors added to an integrated circuit die
        or package to reduce supply noise.
        Defects per million (DPM)  The number of defects per million parts shipped.
        DeMorgan’s theorem  A theorem of boolean logic stating that any function is
        equal to the same function with all ANDs changed to ORs, all ORs changed to
        ANDs, and all terms inverted.
        Design automation engineer  An engineer responsible for the creation and/or
        maintenance of CAD tools used in design.
        Design for test (DFT) circuits  Circuits used specifically to help detect manu-
        facturing defects. These circuits are also commonly used to help in silicon debug.
        Device limited layout  Layout where the area required is determined prima-
        rily by the number of transistors and their sizes. See wire limited layout.

        DFT   Design for test.
        Die paddle  The portion of the leadframe for a plastic package to which the die
        will be attached. Also called a flag.
        Die separation  The manufacturing step where a wafer is cut into individual die.
        Die side cap (DSC)  Decoupling capacitors placed on the same side of the pack-
        age substrate as the die.

        Die yield  The percentage of functional die on each completed wafer.
        Diffusion region  A region where N-type or P-type dopants have been added
        to a semiconductor to create free charge carriers.
        Diode  A circuit element allowing current to flow in only one direction. Typically
        formed by a single P-N junction.
        DIP  Dual in-line package.
        Direct chip attach (DCA)  Attaching a bare integrated circuit die directly to a
        printed circuit board. Also called chip on board (COB).
        Direct mapped cache  A cache memory that stores each memory address in a
        single location.
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