Page 51 - A Practical Guide from Design Planning to Manufacturing
P. 51

The Evolution of the Microprocessor  27

        used, but this has a K value of 4. New materials are being tried to
        reduce K to 3 or even 2, but these materials tend to be very soft and
        porous. When heated by high electrical currents the metal wires tend
        to flex and stretch and soft dielectrics do little to prevent this. Future
        interlevel dielectrics must provide reduced capacitance without sacri-
        ficing reliability.
          One of the common sources of interconnect failures is called electro-
        migration. In wires with very high current densities, atoms tend to be
        pushed along the length of the wire in the direction of the flow of elec-
        trons, like rocks being pushed along a fast moving stream. This phe-
        nomenon happens more quickly at narrow spots in the wire where the
        current density is highest. This leads these spots to become more and
        more narrow, accelerating the process. Eventually a break in the wire is
        created. Rigid interlevel dielectrics slow this process by preventing the
        wires from growing in size elsewhere, but the circuit design must make
        sure not to exceed the current carrying capacity of any one wire.
          Despite using new conductor materials and new insulator materials,
        improvements in the delay of interconnects have continued to trail
        behind improvements in transistor delay. One of the ways in which
        microprocessors designs try to compensate for this is by adding more
        wiring layers. The lowest levels are produced with the smallest dimen-
        sions. This allows for a very large number of interconnections. The high-
        est levels are produced with large widths, spaces, and thickness. This
        allows them to have much less delay at the cost of allowing fewer wires
        in the same area.
          The different wiring layers connect transistors on a chip the way
        roads connect houses in a city. The only interconnect layer that actually
        connects to a transistor is the first layer deposited, usually called the
        metal 1 or M1 layer. These are the suburban streets of a city. Because
        they are narrow, traveling on them is slow, but typically they are very
        short. To travel longer distances, wider high speed levels must be used.
        The top layer wires would be the freeways of the chip. They are used to
        travel long distances quickly, but they must connect through all the
        lower slower levels before reaching a specific destination.
          There is no real limit to the number of wiring levels that can be added,
        but each level adds to the cost of processing the wafer. In the end the
        design of the microprocessor itself will have to continue to evolve to
        allow for the greater importance of interconnect delays.


        Microprocessor scaling
        Because of the importance of process scaling to processor design, all
        microprocessor designs can be broken down into two basic categories:
        lead designs and compactions. Lead designs are fundamentally new
   46   47   48   49   50   51   52   53   54   55   56