Page 171 - Book Hosokawa Nanoparticle Technology Handbook
P. 171

3.5 INTERACTIONS BETWEEN PARTICLES                                           FUNDAMENTALS
                  should be able to thoroughly understand only after  for the present nanometer scale measurement, became
                  measuring them directly and precisely.         possible by introducing fringes of equal chromatic
                                                                 order (FECO) interferometry developed by Tabor et
                  (1) Surface forces measurement                 al. [3]. The DLVO theory for discussing the stability
                  (a) Surface forces                             of colloidal dispersions was proved in the late 1970s,
                                                                 when a prototype of the present surface forces appa-
                  The surface forces are proportional to the surface area
                  involved. Frictional and adhesion forces are also a  ratus (SFA) was completed for the measurements of
                  part of the surface forces. Typical surface forces are  surface interactions in liquids [4].
                  van der  Waals force, electrical double-layer force  The surface force apparatus as well as the colloidal
                  between charged surfaces, steric forces due to the size  probe atomic force microscopy [5] are employed for
                  and shape of molecules, and the solvation force. The  surface force measurements. When we use the former
                  first two forces, i.e. van der Waals force and electrical  instrument, the resolutions of distance and force are
                  double-layer force, are called the DLVO force, and  0.1 nm and 1 nN, respectively. The geometry of the
                  other forces are often classified as the non-DLVO  sample surfaces is in two crossed cylinders for the
                  force (see Sections 3.5.1 and 3.5.2).          former, and a sphere and a flat plate for the latter.
                                                                 From the early stage of this research, these geometries
                  (b) Surface forces measurement                 have been adopted to avoid the complicated adjust-
                                                                 ment such as keeping two flat surfaces parallel. It is
                  This method directly measures the distance depend-
                  ence of interaction (interaction potential) between  known that the measured surface force (F) normal-
                  surfaces using a spring balance. It provides the  ized by the radius of the surface curvature (R) is pro-
                  knowledge about the distance dependence and magni-  portional to the interaction energy between flat
                  tude of the surface forces. It is also possible to calcu-  surfaces (G ) (F/R 2 G : Derjagnin approxima-
                                                                                      f
                                                                          f
                  late the force, adhesive force, necessary for separating  tion), therefore, this geometry is also convenient for
                  the surfaces in the adhesive contact [1].      comparing the experimental results with the theory.
                    Surface force measurement was first developed to
                  realize the dispersion forces. The initial attempt of  (c) Measurement method [6]
                  this measurement dates back in the 1930s [2]. The  The conventional surface force measurement is based
                  precise measurement of distance, which is necessary  on the spring balance (Fig. 3.5.18). The interaction




                                          Distance



                                                     Spectroscope
                                  Interference Fringes                  DC Motor or Pulse Motor





                                    Resolution
                                    Distance : 0.1 nm
                                    Force : 10 nN
                                                                        Double Cantilever
                                                                        (Spring Const.K)



                                                                              Spring Displacement
                                                                White Light
                                                                          Surface Force


                  Figure 3.5.18
                  Surface forces apparatus.

                                                                                                        147
   166   167   168   169   170   171   172   173   174   175   176