Page 378 - Book Hosokawa Nanoparticle Technology Handbook
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FUNDAMENTALS                           CH. 6 EVALUATION METHODS FOR PROPERTIES OF NANOSTRUCTURED BODY
                  for a circle with a radius of R/2 and a center position  respectively. Individual component values can be
                  of (R/2, 0) [3]. An equivalent circuit for ceramic mate-  obtained by selecting appropriate component values
                  rials is often represented as a complex circuit in which  so as to obtain agreement between measured and cal-
                  parallel circuits are connected in series. An imped-  culated impedance plots. The software applicable to
                  ance plot for the above equivalent circuit is shown in  each measurement system has already been commer-
                  Fig. 6.4.10, and the component resistances of the  cialized for such analysis [5].
                  grain interior and grain boundary can be estimated  For a clear separation of semicircles in the imped-
                  from the diameter of individual semicircles. However,  ance plots, it is necessary that the component resist-
                                                      *
                  markedly different time constants   (  1/    RC;  ances in an equivalent circuit have the same values
                   *
                    is the angle frequency at the top of a semicircle) of  within one order of magnitude. When the component
                  individual semicircles are necessary for the separation  resistances are considerably different but the compo-
                  of semicircles.                                nent capacitances are the same, the use of a complex
                    Actual composite materials have various compo-  modulus plot is effective. The complex modulus M is
                  nent resistances from constituent grains, interfaces  the inverse of complex permittivity   and is expressed
                  and electrodes, and various equivalent circuits are  by M   M   jM      1    (   j  )  1  [6]. An example
                  assumed. Recently, a method of estimating compo-  is shown in Fig. 6.4.12. It is found that a separation of
                  nent resistances and capacitances has been developed  component circuits can be realized in the modulus plot
                  and is now widely used. This method involves com-  even for an equivalent circuit in which the separation
                  paring a measured impedance plot with a calculated  of such components is difficult in an impedance plot.
                  one assuming appropriate circuit configuration and  A study to determine an equivalent circuit for a layer-
                  component resistances/capacitances. An example of  structured ferroelectric crystal has been reported [7].
                  results by this method for an inorganic-polymer com-
                  posite is shown in Fig. 6.4.11 [4]. The composite was  6.4.2.4 Nanoscale evaluation using microprobes
                  prepared by mixing a WO precursor solution with an  Recently, there has been rapid progress in the tech-
                                       3
                  epoxy-based prepolymer, hardening the mixture into a  nology of scanning tunneling microscopes (STMs)
                  thick film and then precipitating oxide hydrate (WO 3  and atomic force microscopes (AFMs), which enable
                  plate-like particles of approximately 300 nm size) in  the determination of the electronic states and topogra-
                  the composite by acid treatment. The subscripts 0, 1,  phy of material surfaces through the use of micro-
                  2 and 3 in the equivalent circuit indicate inorganic  probes. The conduction properties of a local area of
                  precipitates, interfaces (between inorganic particles  thin films and crystal surfaces can be examined using
                  and particle/matrix), a polymer matrix and electrodes,  such microprobes.


                                            C1             C2            C3









                                            R1             R2            R3
                                           Grain                      Electrode
                                                       Grain boundary
                                                        frequency


                                 Z″





                                                                                           Z′
                                                  R1          R1+ R2              R1+ R2+ R3
                  Figure 6.4.10
                  Equivalent circuit for ceramic materials and impedance plot. R: component resistance, C: component capacitance,
                   *
                    : specific angle frequency. Subscripts 1, 2, 3 indicate grain interior, grain boundary and electrode, respectively.
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