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178                           Principles of semiconductor devices



                                                                             φ - φ - eU
                                                   φ M                        M   S   1

     Fig. 9.17
     The junction of Fig. 9.16 under
     forward bias. The potential barrier
     for electrons on the semiconductor
     side is reduced by eU 1 .


                                   higher band edges is smaller curvature in the vicinity of the junction and a
                                   reduced potential barrier, as shown in Fig. 9.17. Now all electrons having en-
                                   ergies above φ M – φ S – eU 1 may cross into the metal. By analogy with the case
                                   of the p–n junction it follows that the number of carriers (capable of crossing
                                   from the semiconductor into the metal) has increased by a factor exp eU 1 /k B T,
                                   and hence the current has increased by the same factor. Since the current from
                                   the metal to the semiconductor has not changed, the total current is
                                                        I = I 0 [exp(eU 1 /kT) – 1];        (9.25)

                                   that is, a junction of this type is a rectifier.
                                     There is one point I want to make concerning the potential barrier in this
                                   junction. One of the electrodes is a metal, and there are charged carriers in
                                   the vicinity of the metal surface. Does this remind you of any physical con-
                                   figuration we have studied before? Where have we met a potential barrier and
                                   charged carriers giving rise to image charges? In the study of electron emis-
                                   sion in Chapter 6 we came to the conclusion that the image charges lead to a
                                   lowering of the potential barrier, and you may remember that it was called the
                                   Schottky effect. According to the formula we derived there, the reduction was
                                   proportional to (E /  0 ) 1/2 . Well, the same thing applies here with the difference
                                   that   0 should be replaced by   r   0 , where   r is the relative dielectric constant
                                   of the semiconductor. For silicon, for example,   r = 12, the effect is there-
                                   fore smaller. So the Schottky effect is not very large, but it happened to give
                                   its name to these particular junctions. They are usually referred to as Schottky
                                   diodes or Schottky barrier diodes.
                                     Let us now investigate the case when the work function of the metal is smal-
                                   ler than that of the n-type semiconductor. The situation before and after contact
                                   is illustrated in Fig. 9.18. Now, to achieve equilibrium, electrons had to move
                                   from the metal to the semiconductor, establishing there an accumulation re-
                                   gion. There is no potential barrier now from whichever side we look at the
                                   junction. As a consequence the current flow does not appreciably depend on
                                   the polarity of the voltage. This junction is not a rectifier.

                                   9.8  The role of surface states; real
                                   metal–semiconductor junctions
                                   The theory of metal–semiconductor junctions as presented above is a nice,
                                   logical, consistent theory that follows from the physical picture we have de-
                                   veloped so far. It has, however, one major disadvantage: it is not in agreement
                                   with experimental results, which seem to suggest that all metal–semiconductor
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