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9




                                  Optical Lithography








           Lithography work flow consists of the following major  We will discuss lithography first from a tool point of
           steps when viewed from the point of view of the wafer:  view, and then from a pattern point of view: the shape
                                                       and size of patterns that can be printed on the wafer.
           1. Photosensitive film (photoresist) application
           2. Alignment of mask and wafer              9.1 LITHOGRAPHY TOOLS (ALIGNMENT
           3. Exposure of the photoresist              AND EXPOSURE)
           4. Development of patterns.
                                                       The simplest lithographic technique is contact lithog-
                                                       raphy: the photomask and the resist-covered wafer are
           The alternative view is that of information flow; this  brought into intimate contact, and exposed. The resolu-
           will be discussed in Chapter 10 in conjunction with  tion is determined by mask dimensions and diffraction
           lithography simulation.                     at mask edges. Extremely small patterns can be made
             Optical lithography is basically photography. The  in theory but making photomasks with submicron fea-
           original image to be transferred, the photomask, which  tures is prohibitively expensive. Damage to mask is
           corresponds to the negative in photography, is set  frequent when the mask and the wafer are brought into
           in a mask-aligner/exposure tool. It is aligned to the  contact, which makes contact printing not very produc-
           photoresist-coated wafer, and exposed by UV radiation  tion worthy.
           (Figure 9.1). Exposure changes photoresist solubility,  Proximity lithography is a modification of contact
           which enables selective removal of resist in the develop-  lithography: a small gap, for example, 3 to 50 µm is
           ment step. In positive resists, the exposed areas become  left between the mask and the wafer. The wavefront
           more soluble in the developer, and in negative resists,  traversing the mask is diffracted by the mask patterns,
           the exposed parts become insoluble.         and Fresnel diffraction formulae have to be used
             This resist pattern can be used as an etch mask. Pho-  to estimate resolution. Both contact and proximity
           toresist is removed after etching. The patterning process  lithography are done in one and the same machine: the
           continues with new doping and deposition steps, and  gap between the mask and the wafer is an adjustable
           new lithographic steps. Layers have to be aligned to  parameter, with values from zero up (Figure 9.2).
           each other, as in multiple exposure photography. Over-  Contact/proximity lithography systems are 1X: the
                                                       image is the same size as the original. The role of
           lay of successive layers is a critical factor in lithography,
                                                       optical system I (Figure 9.1) is then to provide uniform
           not only in resolution.
                                                       illumination. Optical system II does not exist.
             There are three rather different elements in the optical
                                                         In projection optical systems, the optical system II of
           lithography process:
                                                       Figure 9.1 is the key element: it provides an image of
                                                       the mask on the wafer. Reduction optics can be used,
           • Optics: radiation generation, propagation, focusing,  and this is a great improvement over 1X systems. With
            diffraction, interference;                 5X reduction projection optics, the original photomask
           • Chemistry: photochemical reactions in the resist,  features can be made rather large, for example, 1 µm for
            development;                               0.2 µm final feature size. Fraunhofer far-field diffraction
           • Mechanics: mask-to-wafer alignment.       governs the optics of projection systems.

           Introduction to Microfabrication  Sami Franssila
            2004 John Wiley & Sons, Ltd  ISBNs: 0-470-85105-8 (HB); 0-470-85106-6 (PB)
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