Page 245 - Sami Franssila Introduction to Microfabrication
P. 245

224 Introduction to Microfabrication



                                    n-diffusion  Porous silicon        Single crystal silicon
                          p-diffusion                             Cavity





                           p-silicon 10 ohm-cm  p-silicon 10 ohm-cm   p-silicon 10 ohm-cm
                                 (a)                  (b)                   (c)
            Figure 22.15 (a) A shallow n-diffusion and a deeper p-diffusion; (b) lateral porous silicon formation in the heavily
            boron-doped region and (c) dilute KOH sacrificial etching releases a single-crystalline n-silicon bridge. Redrawn after
            Lee, C.-S., Lee, J.-D. & Han, C.-H. (2000), by permission of Elsevier

               be smaller than nitride deposition non-uniformity  6. Design a fabrication process for the polymer hinged
               of 3%?                                      mirror shown in Figure 22.12(a).
            2. Design a fabrication process for the suspended silicon  7. Design a fabrication process for the fluidic filter
               bridge shown below. Consider two cases: a bridge  shown in Figure 22.1. Also draw the photomasks that
               made of LPCVD polysilicon and a SOI device silicon  show how the filter is anchored to the substrate.
               layer bridge.                             8. What are the lithography steps and sacrificial layers
                                                           needed to make a 3D coil with a Ni core (transformer)
                                                           shown in Figure 22.9(b)?
                                    Suspended
                                       part
                                                         REFERENCES AND RELATED READINGS
                                                         Bellet, D. & Canham, L.: Controlled drying, Adv. Mater., 10
                                                          (1998), 487.
                                     Si
                                                         Bruschi, P. et al: Micromachined silicon suspended wires with
                                                          submicrometric dimensions, Microelectron. Eng., 57–58
                                         SiO 2
                                                          (2001), 959.
                                Si                       Bustillo, J. et al: Surface micromachining for microelectrome-
                                                          chanical systems, IEEE Proc., 86 (1998), 1559.
                                                         Chu, W.-H. et al: Silicon membrane nanofilters from sacrificial
                                                          oxide removal, J. MEMS, 8 (1999), 34.
                                                         Hedrich, F., Billat, S. & Lang, W.: Structuring of membrane
               From Bruschi, P. et al. (2001), by permission of  sensors using sacrificial porous silicon, Sensors Actuators,
               Elsevier.                                  84 (2000), 315.
                                                         Lammel, G. & Renaud, Ph.: Free-standing mobile 3D porous
            3. Comb-drive fabrication tolerance: resonant frequency
                                                          silicon microstructures, Sensors Actuators, 85 (2000), 356.
               of a surface micromachined resonator with straight
                                                         Lee, C.-S., Lee, J.-D. & Han, C.-H.: A new wide-dimensional
               flexures (see Figure 22.4(a)) is given by
                                                          freestanding microstructure fabrication technology using
                                                          laterally formed porous silicon as a sacrificial layer, Sensors
                                   3
                               3
               f 0 = (1/2π){(4EtW /ML ) + (24σ r Wt/5ML)} 1/2  Actuators, 84 (2000), 181.
                                                         L¨ ochel, B. et al: Ultraviolet depth lithography and gal-
               where E is Young’s modulus, σ r is residual stress  vanoforming for micromachining, J. Electrochem. Soc., 143
               in polysilicon, M is shuttle mass, t is poly thick-  (1996), 237.
               ness, L is flexure length and W is flexure width.  Mehregany, M. & Dewa, A.S.: http://mems.cwru.edu/short-
               What is the effect of fabrication tolerance on reso-  course/, Case Western Reserve University.
               nance frequency? Consider poly thickness and lithog-  Orvis, W.J. et al: Modeling and fabricating microcavity inte-
                                                          grated vacuum tubes, IEEE TED, 36 (1989), 2651.
               raphy/etching variation for some realistic dimensions.
                                                         Pister, K. et al: Microfabricated hinges, Sensors Actuators,
            4. Design proper thicknesses and etched depths to make  A33 (1992), 249.
               the self-aligned rotor shown in Figure 22.11.  Roy, S. et al: Fabrication and characterization of polycrys-
            5. How many photolithography steps are needed to  talline SiC resonators, IEEE TED, 49 (2002), 2323.
               make the polysilicon-hinged mirror structure shown  Suzuki, K. et al: Insect-model based microrobot with elastic
               in Figure 22.13?                           hinges, J. MEMS, 3 (1994), 5.
   240   241   242   243   244   245   246   247   248   249   250