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                   104                       MEMS and Microstructures in Aerospace Applications


                              Standard configuration
                                 contact bridge                    Drive capacitor







                             Alternate configuration







                                 Dielectric         Gold            Substrate
                   FIGURE 5.14 Construction of two standard RF switches: Contact Bridge and Drive Cap-
                   acitor. 16  (From L.P. Schanwald, Radiation Effects on Surface Micromachines Combdrives
                   and Microengines, IEEE, 1998.)




                   position. The switches have slightly different structures: switch A contains an
                   insulating layer between the two metal capacitor plates, whereas switch B does
                   not. The switches were made on GaAs substrates with a dielectric thickness of 2
                   mm. V act was 60 V and the gap between the metal plates was 3.5 mm when open and
                   0.8 mm when closed.
                                                              60
                       The parts were exposed to gamma rays in a Co  source. During irradiation a
                   constant electrical bias was applied; in some cases the top metal plates were biased
                   positive relative to the bottom plates, whereas in others the bias was the reverse.
                   The activation voltage (V act ) was measured following incremental doses of
                   radiation.
                       Figure 5.15 shows V act as a function of dose for switch A. Under positive bias,
                   V act increased approximately linearly with dose. Under negative bias, V act shifted in
                   the negative direction and appeared to degrade more rapidly with dose. Annealing
                   for 3 days under no bias caused a slight recovery (3 V) in V act . Unbiased devices
                   showed no measurable degradation with dose. No significant degradation up to a
                   dose of 150 krad (GaAs) was found for switch B.
                       Previous studies of radiation damage in accelerometers suggest that the buildup
                   of charge in an insulator alters the magnitude of an electric field applied across that
                   insulator. In the case of the RF switch, the trapped charge in the insulator either
                   reduces or increases V act , depending on the charge distribution in the dielectric. V act
                   becomes more positive for both bias configurations if the charge produces a positive
                   V act . On the other hand, V act becomes more negative for both bias configurations
                   when V act is negative. In fact, V act in the two bias configurations are always
                   opposite, one increasing and the other decreasing in magnitude. No radiation-
                   induced changes in V act were observed for switch B.




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