Page 68 - MEMS and Microstructures in Aerospace Applications
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1.9.2005 9:00pm
           Osiander / MEMS and microstructures in Aerospace applications DK3181_c003 Final Proof page 58
                                 MEMS and Microstructures in Aerospace Applications
        58
                                               KOH etch
                                                    HF release
                                                stop
                                                     etch stop
                                             p +
                     Micromechanical device area
                                                 2 µm arsenic-doped epitaxial layer
                              layer
                              Mechanical
                                                               N +  antimony-doped substrate
                                       Tungsten / TiN
                                              TiSi 2  / TiN
                                  TiN Anchor Point
                                            p +
                                                                   MEMS-microelectronics integration.  process
                                            p +
                                               N-tub               to
                      CMOS device area  Poly 2  p +                approach
                                  Si 3 N 4  passivation  2-ply poly-Si  first

                                            p +                    Microelectronics


                                                P-tub              3.18          © 2006 by Taylor & Francis Group, LLC
                               Al bond  pad   TiN                  FIGURE
   63   64   65   66   67   68   69   70   71   72   73