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                    MEMS Fabrication                                                 55


























                    FIGURE 3.15 Masks and cross-section of a post composed of anchored layers.



                       Figure 3.15 illustrates the SUMMiT V masks and layers to fabricate a post
                    containing all the structural layers. For this particular structure the dimple and the
                    hub capabilities of SUMMiT are not utilized.
                       The SUMMiT V sacrificial surface micromachine fabrication process is capable
                    of fabricating complex mechanisms and actuators. The ability to fabricate a low-
                    clearance hub enables the rotary mechanisms and gear reduction systems shown in
                    Figure 3.16. Figure 3.17 shows a vertically erected mirror that is held in place by
                    elastic snap hinges. The vertical mirror is mounted upon a rotationally indexable
                    table driven by an electrostatic comb drive actuator. SUMMiT V has also been used
                    to fabricate large arrays of devices that are enabled by the fact that surface micro-
                    machined devices are assembled when they are fabricated.


                    3.6 INTEGRATION OF ELECTRONICS AND MEMS
                         TECHNOLOGY
                    The integration of electronic circuitry with MEMS technology becomes essential
                    for sensing applications, which require increased sensitivity (e.g., Analog Devices
                                      32
                    ADXL accelerometers ), or actuation applications, which require the control of
                    large arrays of MEMS devices (e.g., Texas Instruments Digital Mirror Device
                         1 33
                    [DMD ] ). For sensor applications the packaging integration of a MEMS device
                    and an electronic ASIC becomes unacceptable when the parasitic capacitances and
                    wiring resistances impact sensor performance (i.e., RC time constants of the
                    integrated MEMS system are significant). For actuation applications such as a
                    large array of optical devices that require individual actuation and control circuitry,
                    a packaging solution becomes untenable with large device count.




                    © 2006 by Taylor & Francis Group, LLC
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