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302 Chapter Nine
9. What is meant by a damascene process? What is meant by dual
damascene?
10. [Bonus] Make a list of as many elements as possible that are used
in semiconductor manufacturing and what they are used for.
11. [Bonus] Draw a cross section of the layout in Fig. 9-32 for a cutline
running through the center of the poly line forming the NMOS gate.
12. [Discussion] What are likely to be the most serious manufacturing
obstacles to further process scaling?
Bibliography
Adtek Photomask. “Photomask Manufacturing: Concepts and Methodologies.” 2002.
Allen, Phillip and Douglas Holberg. CMOS Analog Circuit Design. New York: Oxford
University Press, 2002.
Baker, Jacob. CMOS: Circuit Design, Layout, and Simulation. 2d ed., New York: Wiley-
Interscience, 2005.
Brand, Adam et al. “Intel’s 0.25 Micron, 2.0 Volts Logic Process Technology.” Intel
Technology Journal, 1998, pp. 1–9.
Campbell, Stephen. The Science and Engineering of Microelectronics Fabrication. 2d ed.,
New York: Oxford University Press, 2000.
Carcia, Peter et al. “Thin Films for Phase-Shift Masks.” Vaccum and Thin Film.
Libertyville, IL: IHS Publishing Group, 1999.
Foll, Helmut. “Electronic Materials.” 2005, http://www.tf.uni-kiel.de/matwis/amat/elmat_en.
[Extremely accessible and extremely detailed, this is the best online semiconductor
manufacturing reference I could find.]
Jones, Scotten. “Introduction to Integrated Circuit Technology.” 3d ed., www.icknowledge.com.
Pati, Buno. “Tutorial on Subwavelength Lithography.” Design Automation Conference, New
Orleans, LA: 1999.
Plummer, James, Michael Deal, and Peter Griffin. Silicon VLSI Technology Fundamentals:
Practice and Modeling. Englewood Cliffs, NJ: Prentice-Hall, 2000.
Roberts, Bruce et al. “Interconnect Metallization for Future Device Generations.” Solid
State Technology, 1995, pp. 69–78.
Singer, Pete. “The Interconnect Challenge: Filling Small, High Aspect Ratio Contact Holes.”
Semiconductor International, 1994, pp. 57–64.
Stix, Gary. “Shrinking Circuits with Water.” Scientific American, July 2005.
Sze, Simon. VLSI Technology. 2d ed., New York: McGraw-Hill, 1988.
Thompson, Scott. et al. “A 90nm Logic Technology Featuring 50nm Strained Silicon
2
Channel Transistors, 7 layers of Cu Interconnects, Low k ILD, and 1um SRAM Cell.”
IEDM, 2002, pp. 61–64. [A detailed description of Intel’s 90-nm fabrication process.]
U.S. Patent No. 6,329,118. “Method for Patterning Dual Damascene Interconnects Using
a Sacrificial Light Absorbing Material.” 2003.
Van Zant, Peter. Microchip Fabrication: A Practical Guide to Semiconductor Processing.
2d ed., New York: McGraw-Hill, 1990. [Great reference for details of the entire
manufacturing flow.]