Page 41 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
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ETCHING  ELECTRONIC  MATERIALS   23

     Let  us consider,  as  an  example,  etching  of  silicon.  For  silicon,  the  most  commonly used
     etchants  are mixtures  of nitric  acid  (HNOs) and hydrofluoric acid  (HF)  in water or  acetic
     acid  (CH3COOH).  Wet chemical  etching  usually proceeds  by  oxidation.  Initially,  silicon
     is  oxidised  in  the  presence  of  holes  as follows:
                               Si +  2H+   > Si 2+  +  H 2                 (2.9)

     Water  dissociates  according  to  the reaction

                                H 2O    >  (OH) -  +H +                   (2.10)
     The hydroxyl ions  (OH) -  recombine  with positively charged  silicon  ions to form  SiO2 in
     two  steps:
                             Si 2+  +  2(OH)  > Si(OH) 2                  (2.11)

     and
                                           > SiO 2 +                      (2.12)
                               Si(OH) 2            H 2
          dissolves  in  HF  acid  according  to  the reaction
     SiO 2
                            SiO 2 +  6HF  » H 2SiF 6 +  2H 2O             (2.13)

     where  H 2SiFe  is  soluble  in  water.  The  reactions  of  (2.9)  to  (2.13)  may  be  represented
     with  HNO 3  by  the  following overall reaction:

                   Si +  HNO 3 + 6HF   * H 2SiF 6  + HNO 2 + H 2O + H 2   (2.14)
     The  chemical  solution  used  for  gallium  arsenide  (GaAs)  etching  is  a  combination  of
     hydrogen  peroxide  (H 2O 2)  and  sulfuric  acid  (H 2SO 4)  dissolved  in water. Dielectrics  and
     metals  are etched  using the  same chemicals  that dissolve  these materials  in bulk form and
     involve  their  conversion  into  soluble  salts  or  complexes.  Generally,  film  materials  will
     etch  more  rapidly  than their bulk counterparts.
       Etching  processes  are characterised  by  three parameters:

     1.  Etch rate
     2.  Etch selectivity
     3.  Etch uniformity

     The etch rate is defined  as the material  thickness  etched per unit time. Etch selectivity  is a
     measure of how effective  the etch process  is in removing the material  to be etched without
     affecting  other  materials  or films present  in the wafer.  Quantitatively, etch  selectivity  can
     be expressed  as the ratio between the etch rate of the material  to be etched  and etch-mask
     materials on the wafer.  Table  2.5 lists the properties  of different  wet etchants for  different
     materials.


     2.4.2  Dry Etching

     The  basic  concept  of  dry  or  plasma  etching  is  very  simple.  A  glow  discharge  is  used
     to  generate chemically reactive  species  (atoms, radicals,  and ions)  from  a relatively inert
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