Page 332 - Book Hosokawa Nanoparticle Technology Handbook
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5.5 GRAIN BOUNDARIES AND INTERFACES                                          FUNDAMENTALS

                                                                    4
                   Surface

                                                   Characteristic
                         Conduction band              X-ray         3

                                                                   Transmissivity  2
                         Valence band
                                                    Process 3

                   L  shell                        E L3
                    3
                   L  shell                        E L2
                    2
                                                                    1
                     shell                         E
                   L 1                              L1
                        Incident          Process 2
                        electron
                                                                    0
                                                                      0     200    400   600    800    1000
                   K shell                        E K                          Acceleration Voltage (kV)
                               Process1
                                                                 Figure 5.5.10
                                        Energy-loss              Transmissivity of electrons at different acceleration
                                        electron                 voltages, with comparison to at 100 kV.
                   nucleus
                  Figure 5.5.9
                  Interaction between the incident electron and the sample.



                  “fall” into the lower shell and fill the vacancy
                  (Process 2 in Fig. 5.5.9). As the electron “falls”, it
                  emits X-rays to balance the total energy of the atom
                  (Process 3 in Fig. 5.5.9).
                    In the case of thinner specimen or higher accelera-
                  tion voltages, the transmissibility (Fig. 5.5.10) of
                  electron becomes larger.
                    Furthermore, EDS can be combined with STEM
                  system, in which an electron beam is scanned across
                  a defined line or region of the specimen, so that a
                  line-profile or an elemental-map can be obtained.
                  (Fig. 5.5.11). Within the range of sample thicknesses
                  studied and with the mass absorption coefficients for
                  the characteristic X-rays, absorption corrections for  Figure 5.5.11
                  transforming intensity ratios to concentration ratios  EDS elemental map of high-Cr Steel.
                  are unnecessary. The standard Cliff–Lorimer (1975)
                  relationship is given by                        Furthermore, in the case of thin specimen, the char-
                                                                 acteristic X-ray intensity is given by equation (5.5.2),
                                   C  A    I  A
                                         k AB           (5.5.1)                      ⎛  Qa⎞
                                   C  B    I  B                                I    N 0 ⎜ ⎝     ⎟  t    (5.5.2)
                                                                                        A ⎠
                                                                                A
                  where C and C are the weight fractions of elements                       A
                         A
                               B
                  A and B respectively, and I and I are the character-  I is the characteristic X-ray intensity of element A,
                                                                 A
                                        A
                                             B
                  istic X-ray intensities of elements  A and  B, respec-  N the Avogadro number, Q the ionization cross sec-
                                                                  0
                  tively, above background, and k AB  is the Cliff–Lorimer  tion,   the fluorescent yield, a an intensity ratio, A the
                  factor which is independent of composition and also  atomic weight,    the density, and  t the specimen
                  independent of thickness.                      thickness.
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