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154    Cha pte r  F o u r

               the output signals typically are in the region 0.1 < V   < 1 V. So if a
                                                            pyro
               clear impact of the sensor signal on the OTFT current is desired, the
               threshold voltage of the transistor should not be an order of magni-
               tude larger. Second, the OTFT input really needs to have a high-
               impedance input (~ gigaohms) in order not to unwillingly downscale
               the sensor signal. That means basically that the gate dielectric has to
               be very dense with low leakage currents and sufficiently high break-
               down strengths. Third, the overall performance and stability should
               be sufficient for the targeted application (that could be an interesting
               point in the case of automotive industry driven applications). And
               last but not least, the fabrication process should be compatible with
               large-area processing on flexible substrates, thus arguing for printing
               and large-area evaporation techniques.

               Low-Voltage OTFTs
               Reducing the threshold voltage and also the subthreshold swing is
               essential for operating OTFTs at low-voltage levels. When combined
               with very low gate leakage currents, OTFTs may also become a key
               element in high-end sensor applications, such as flexible touchpads
               and screens or thermal imaging tools for night vision, surveillance, or
               for the detection of undesired heat loss paths in buildings.
                   The aforementioned transistor parameters critically depend on
               not only the thickness and the dielectric properties of the gate insula-

               tor, but also the trapped charge densities at the interface between
               these materials.  The selection of semiconductors and gate insulators
                            33
               with excellent interface properties is currently the challenge in the
               quest for improving the performance of OTFTs.
                   Figure 4.23a shows the structure of low-voltage organic transistors
               with high dielectric constant (high-k) oxide–polymer nanocomposites.
               Al O  or ZrO  was chosen as high-k dielectric materials, combined with
                 2  3     2
               poly-alpha-methylstyrene (PαMS) or poly-vinyl-cinnamate (PVCi) to



                                                             Al-Gate-Electrode
                     Source  Drain
                                                                  Substrate
                                   50 nm Au
                     50 nm Pentacene                              ZrO + PαMS
             PVCi or PαMS
                               Al 2 O 3  or ZrO 2
                      Nanocomposite                 Pentacene + PαMS
                        Gate              50 nm Al
                       Substrate                200 nm
                                                      Gold-S/D-Electroden
                         (a)                               (b)
          FIGURE 4.23  (a) Architecture of low-voltage OTFTs based on a high-k nanocomposite
          gate dielectric and pentacene as the organic semiconductor. (b) Transmission
          electron microscope (TEM) image of a lamella cut by focused ion beam from a
          device similar in architecture to that of (a). (Figure 4.23a from Ref. 35. Copyright
          Wiley-VCH Verlag GmbH & Co. KGaA. Reproduced with permission.)
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