Page 32 - Organic Electronics in Sensors and Biotechnology
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Scaling Effects in Organic Transistors and Transistor-Based Chemical Sensors   9

               and higher substrate temperatures during sublimation tend to pro-
               duce an organic layer with large grain size and planar morphology.
               The substrate temperature has a stronger influence than the sublima-
               tion rate. However, attempts to deposit large pentacene grains onto
               nanoscale channels at elevated substrate temperatures did not yield
               favorable results. This could be attributed to the repulsion of the Au
               electrodes from the pentacene molecules at elevated substrate tem-
               peratures. Usually 300 to 350  Å is the minimal thickness for the
               organic semiconductor to uniformly cover the channel region,
               whereas too thick an organic layer will not increase the gate-induced
               channel conduction (the channel is only one or two monolayers deep)
               but increase the non-gate-induced bulk conduction and therefore
               reduce the on/off current ratio of the field-effect transistor. To form
               an organic semiconductor layer with high mobility in field-effect
               transistors, the requirements for the quality and the morphology of
               the organic thin film are exacting. The source material has to be in
               high purity, usually post-purchase purified with cycling many times
               under a temperature gradient in vacuum. The grown film has to be
               uniform and flat and have an ordered molecular stacking. For this
               purpose, after UV ozone or gentle oxygen plasma cleaning, a surface
               treatment is desired to form a well-ordered self-assembled monolayer
               of alkyl groups, before depositing an organic semiconductor layer.
               Two commonly used materials for a self-assembled monolayer (SAM)
               on top of SiO  are HMDS (hexamethyldisilazane) and OTS [trichloro
                           2
               (octadecyl)silane], because these molecules have two functional
               groups: silane group on one end to bond with SiO  and alkyl group
                                                          2
               on the other end to provide a hydrophobic layer for the molecules
               of organic semiconductor to grow. This self-assembled monolayer
               will improve the molecular ordering of the pentacene layer and
               reduce the trapped charges at the dielectric-semiconductor inter-
               face, which will enhance the field-effect mobility and improve the
               subthreshold slope. 47, 48  Within the other type of SAM agent molecule
               4-nitrobenzenethiol to treat the interface between organic semicon-
               ductor and electrodes, its surface active head group (thiol) can anchor
               to the electrodes through a dative bond between the sulfur atom and
               the metals such as Au, Pd, Pt, and Ag. This treatment can signifi-
               cantly reduce the contact resistance by a factor of 10 at room tempera-
                                                 48
               ture and even more at low temperatures,  which is important for the
               low-temperature measurements described here. Ideally, HMDS only
               forms a monolayer on SiO , without chemisorption onto electrodes,
                                      2
               and 4-nitrobenzenethiol only adsorbs onto electrodes. This ideally
               gives an orthogonal self-assembly without interaction between
               dielectric treatment and contact treatment. 47
                   For the device characterization, a Table Top Manipulated Probe
               System from Desert Cryogenics was employed, at varying tempera-
                                                                      4
               tures and over two orders of magnitude of electric field (from 10  to
                 6
               10  V/cm). The DC I–V characteristics for all transistors of different
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