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186             Renewable Energy Devices and Systems with Simulations in MATLAB  and ANSYS ®
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               90                                      90
                    DFIG            Diode 63.2 °C                Diode            PMSG
               85                                      85
                                    IGBT 58.1 °C       80
               80
              Junction temperature (°C)  75  Diode    Junction temperature (°C)  75


               70
                                                       70
               65
                                                       65
               60

               55                                      60     IGBT             Diode 74.9 °C
                                                       55
                                    IGBT                                       IGBT 62.5 °C
               50                                      50
                  9      9.05    9.1    9.15    9.2       9      9.05    9.1    9.15    9.2
             (a)               Time (s)              (b)               Time (s)

            FIGURE 8.10  Junction temperature of power devices of a 2 MW wind power converter with different genera-
            tors using the operation profiles shown in Figure 8.9 (DFIG-based converter, PMSG-based converter). (From
            Zhou, D., Reliability assessment and energy loss evaluation of modern wind turbine systems, PhD thesis,
            Aalborg University, Aalborg, Denmark, 2014; Hirschmann, D. et al., IEEE Conference on Vehicle Power and
            Propulsion, pp. 1–6, September 7–9, 2005.)



            TABLE 8.2
            Silicon Power Semiconductor Devices for Wind Power Application

                                                                   IGCT
                                 IGBT Module      IGBT Press-Pack  Press-Pack  SiC-MOSFET Module
            Power density    Low                  High          High        Low
            Reliability      Moderate             High          High        Unknown
            Cost             Moderate             High          High        High
            Failure mode     Open circuit         Short circuit  Short circuit  Open circuit
            Insulation of heat sink  +            −             −           +
            Snubber requirement  −                −             +           −
            Thermal resistance  Large             Small         Small       Moderate
            Cost             Moderate             High          High        High
            Gate driver      Moderate             Moderate      Large       Small
            Major manufacturers  Infineon, Semikron,   Westcode, ABB  ABB   Cree, Rohm, Mitsubishi
                              Mitsubishi, ABB, Danfoss
            Voltage ratings  1.7 kV–6.5           2.5/4.5 kV    4.5 kV/6.5 kV  1.2 kV/10 kV
            Max. current ratings  1.5 kV–750 A    2.3 kA/2.4 kA  3.6 kA/3.8 kA  180 A/10 A



            record of applications and fewer mounting restrictions. However, module packaging devices may suf-
            fer from larger thermal resistance and lower power density and might have higher failure rates [62].
            The main trends to improve the packaging technology of the IGBT module are to introduce pres-
            sure contact to eliminate the base plate and thus base plate soldering, sinter technology to avoid the
            chip soldering, and replace bond wire material to reduce the coefficient of thermal expansion—all
            leading to increased lifetime of module packaging IGBTs as reported in [63]. However, the cost is
            always a critical factor in these new technologies.
              The press-pack packaging technology improves the connection of chips by direct press-pack
            contacting, which leads to improved reliability, higher power density (easier stacking for series
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