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                                                     MICROLITHOGRAPHY

                   9.10  WAFER PROCESSING

                               difficult to solve without the aid of a powerful computer. A simpler approach is to artificially decou-
                               ple the electric and magnetic field vector components and describe light as a scalar quantity, and then
                               to use simplified (assumed) boundary conditions. Under most conditions scalar diffraction theory is
                               surprisingly accurate. In lithography, the distance from the mask to the objective lens is very large, so
                               that the scalar diffraction theory is at its simplest, called Fraunhofer diffraction.
                                 In order to establish a mathematical description of diffraction by a mask, let us describe the elec-
                               tric field transmittance of a mask pattern as t (x, y), where the mask is in the x − y plane and t (x, y)
                                                               m                                  m
                               has in general both magnitude and phase. For a simple chrome-glass mask, the mask transmittance
                               is assumed to be binary—t (x, y) is 1 under the glass and 0 under the chrome. Let the x′ − y′ plane
                                                  m
                               be the diffraction plane, that is, the entrance to the objective lens, and let z be the distance from the
                               mask to the objective lens. Finally, we will assume a monochromatic light of wavelength l and that
                               the entire system is in air (so that its index of refraction can be dropped). Then, the electric field of
                               our diffraction pattern T (x′, y′) is given by the Fraunhofer diffraction integral
                                                m
                                                                          x +
                                                                         (
                                                      ( ′′
                                                    T x y ) =  ∫ ∞  ∫ ∞  t x y e −2p if x f y) dxdy  (9.2)
                                                                             y
                                                                      )
                                                                   (
                                                        ,
                                                                    ,
                                                     m       −∞  −∞  m
                               where fx = x′/(zl) and fy = y′/(zl) and are called the spatial frequencies of the diffraction pattern.
                                 For many scientists and engineers, this equation should be quite familiar—it is simply a Fourier
                               transform. Thus, the diffraction pattern (i.e., the electric field distribution as it enters the objective
                               lens) is just the Fourier transform of the mask pattern. This is the principle behind an extremely use-
                               ful approach to imaging called Fourier optics.
                                 Figure 9.7 shows two mask patterns—one an isolated space and the other a series of equal lines and
                               spaces—both infinitely long in the y direction (the direction out of the page). The resulting mask trans-
                               mittance functions t (x) look like a square pulse and a square wave, respectively. The Fourier transforms
                                             m
                               are easily found in tables or directly calculated and are also shown in Fig. 9.7. The isolated space gives
                               rise to a sinc function diffraction pattern, and the equal lines and spaces yield discrete diffraction orders.
                                                                  sin(p  wf )
                                                 Isolated space: Tx() ′ =  x
                                                             m
                                                                    p  f x
                                                                     ∞             n 
                                                  Dense space: Tx () ′ =  1  ∑  sin(p  wf ) d   f −    (9.3)
                                                                             x
                                                             m
                                                                  p  n=−∞  p  f  x    x  p
                                                                Mask
                                                                      1
                                                                t (x)  0
                                                                m





                                                                T (x′)                        f
                                                                 m
                                                 0                                0            x

                                                (a)                               (b)
                                      FIGURE 9.7  Two typical mask patterns—an isolated space and an array of equal lines and
                                      spaces—and the resulting Fraunhofer diffraction patterns assuming normally incident plane wave
                                      illumination.


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