Page 100 - Wire Bonding in Microelectronics
P. 100

CHAPTER 4





                                     Wire Bond Testing







         4.1 Introduction
              The measurement methods, techniques, and equations used for
              evaluating wire bonds were developed many years ago and described
              in earlier editions of this book. Few modern papers present new
              approaches, except for the testing of fine pitch ball bonds. Therefore,
              this chapter has been brought up to date, by noting changes required
              by finer pitch (more fully described in Chap. 9), or by changing/adding
              appropriate figures and references when needed rather than com-
              pletely rewriting for the sake of change. Only when a newer figure
              or reference is judged to be better or clearer, will it be added here.
              Several original figures have been redrawn/modified for more com-
              plete or extended understanding and the Web-available EIA shear
              test specification is included and discussed. Many of the recent
              advances have resulted from improvements in the test equipments’
              precision and convenience, rather than fundamental new measure-
              ment methods or principles. The author has added judgments and
              comments thought to be helpful for those new to the field. The latest
              Mil-Std 883G/H criteria are discussed in this chapter, but it is real-
              ized that today there is minimal military-driven production. Com-
              mercial in-house specifications vary widely but are frequently based
              on the web-available military specifications and measurement meth-
              ods which are used internationally. They are a good starting point,
              but often have lower quantitative (compromise) specifications than
              used by many organizations.
                 Autobonders have extended their capability to make very long
              wire loops for small diameters, and techniques have been developed
              to make very low loops. Both of these affect wire bond testing, but the
              equations describing the bond-pull test are still valid in these extreme
              cases, with a few caveats to detail their use/limits.
                 Although the major part of this book is concerned with the yield
              and reliability of wire bonds, the normal method for evaluating these
              problems involves some form of testing. The most common method
              for evaluating wire bonds is still the pull test, primarily destructive,
              but, to a much smaller extent, nondestructive. Details of these tests


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