Page 494 - Instrumentation Reference Book 3E
P. 494

The measurement of resistance, capacitance, and inductance 477





                                                                ,ut
                                                         Detector ,
                                                    ”;     f
                                                22

                   Voltage transformei         Current transformer
                        Z0”t


                                   7; Equivalent circuit
                                        Ut





                                      ____
                                      vs  (Z2 -Z1)
                     Voltage transformer                 z1 llZZ
                                       2  (Z, +Z,)
                     Current transformer   -
                                    (Z,  +zl +Z,Zz/Zc)
                            Zc=jwL,:   L,  is inductance of ratio arms
                                     L, = M,  mutual inductance of ratio arms
             Figure 20.70  Unbalanced inductivelycoupled bridge

             components begin to dominate the measurement.   in  Figure  20.74.  In  measuring  inductance  as
             Therefore rf  bridges employ variable  capacitors   shown in  Figure 20.74(a) the variable  capacitor
             (typically less than 1000 pF) as the adjustable elem-   C which forms a series-resonant circuit with L,,  is
             ents  in  bridges  and  fixed  resistors  whose  phys-   adjusted  until  the  detector  detects  resonance  at
             ical dimensions are small. A bridge which can be   the  frequency f. The  resonance  is  detected  as  a
             constructed  using these elements is the Schering   maximum  voltage  across  C.  At  resonance  Q  is
             bridge, shown in Figure 20.60. Great care has to   given by
             be  taken  with  shielding and wiring layout  in  rf
             bridges to avoid large coupling loops. The imped-
             ance range covered by  such bridges decreases as
             the frequency is raised. At microwave frequencies
             all the wiring is coaxial, discrete components are   and L,,  is given by
             no longer used, and impedance measurements can      1
             only be undertaken  for impedances close to the   LIE  =
             characteristic impedance  of  the system. Further
             details  of  high-frequency  measurements  can  be   The value of R,,  is given by
             found in Oliver and Cage (1971) and Somlo and       1
             Hunter (1985).                               R,s  = &
               The bridged T and parallel T circuits (shown in
             F:gure  70.73 together  with  their  balance  condi-   The self-capacitance of an inductor can be deter-
             tions)  can  be  used  for  measurements  at  rf  fre-   mined by measuring the value of C; say C1, which
             quencies. The parallel  T measurement  technique   resonates with  it at a frequency f together with
             has  the  advantage  that  the  balance  can  be   value  of  C,  say  C,,  which  resonates  with  the
             achieved using two grounded variable capacitors.   inductance at 2  f. Then  Co, the self-capacitance
               Resonance  methods  can also  be  used  for the   of the coil, is given by
             measurement of components at high frequencies.
             One of the most important uses of resonance in
             component  measurement  is the Q meter,  shown
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