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Wet-etched Silicon Structures 207



             All silicon etchants etch aluminium, which means  Table 21.1 Alkaline anisotropic etchants: some main
           that either aluminum deposition has to be done after  features of etchants
           silicon etching, or aluminium has to be protected during
           silicon etching. In some cases aluminum can be replaced  Etchant  KOH  TMAH    EDP
           by another metal, such as gold. Some relief can be  Rate (at 80 C)  1  0.5  1 (at 115 C)
                                                                                              ◦
                                                               ◦
           achieved by saturating TMAH solution with silicon, but  µm/min
           typically only very short alkaline etchings are done after  Typical concentration  40%  25%  80%
           metallization.                              Selectivity (100):(111)  200:1  30:1  35:1
                                                                         200:1  2000:1  10 000:1
                                                       Selectivity Si:SiO 2
                                                       Selectivity Si:Si 3 N 4  2000:1  2000:1  10 000:1
           21.4 ETCH RATE AND ETCH STOP                Etch stop factor  25     10     50
                                                           20
                                                               −3
                                                         (10 cm )
           KOH rate can be made very high: the boiling point
           of 50% KOH is ca. 150 C, which translates to
                                 ◦
           ca. 10 µm/min etch rate for (100) planes. But in addi-  in Table 21.1. Practical etch rates are in the range 0.5
           tion to rate, other factors must be considered: surface  to 1 µm/min.
           roughness increases in alkaline etching beyond bond-  Etch stop is an idealization; infinite selectivities are
           ing quality, so the surfaces to be bonded must be  not met with in the real world. High selectivity is termed
           protected by oxide or nitride mask during KOH etch-  etch stop when selectivity is so high that etch timing
           ing. There have been experiments with ammonia etch-  becomes non-critical. Etch stop can happen through
           ing with arsenic oxide: etch rates of 1.5 µm/min at  various mechanisms.
           70 C have been demonstrated, with high selectivity  Etch rate of boron-doped silicon decreases rapidly
             ◦
                                                                                19
           against oxide and aluminum masks and very smooth  when the doping level exceeds 10 cm −3  (Figure 21.3).
           surfaces, 2.4 nm RMS roughness, whereas typical KOH-  The exact mechanism is unknown but high stresses in
           etched surfaces exhibit 5 to 10 nm RMS roughness.  heavily doped silicon may play a part. Boron etch stop is
           Arsenic and antimony additions to KOH have shown  frequently used in bulk micromechanics, as a way to fab-
           similar results of improved surface smoothness and  ricate simple mechanical structures. The silicon micro-
           increased rate. Standard etch processes are compared  bridge shown in Figure 2.1(b) was done by p ++  etch

                  10 2                                   10 2
                                                                  78°C
                (µm/h)                                 (µm/h)
                                                                  61°C
                  10 1                                   10 1
                                                                  44°C
                                                                  34°C
                Silicon etch rate  10 0  KOH            Etch rate  10 0   3.7 × 10  cm −3


                                                                               19
                         concentration
                                                                               19
                             10%
                                                                       0
                                                                               19
                                                                                   −3
                                                                          4.0 × 10  cm
                             24%                                      C =  3.8 × 10  cm −3
                                                                               19
                             42%                                          4.2 × 10  cm −3
                 10 −1       57%                         10 −1
                         〈100〉 silicon                          〈100〉 silicon
                         60°C                                   24% KOH
                 10 −2                                   10 −2
                   10 17     10 18    10 19  cm −3  10 20  10 17    10 18     10 19  cm −3  10 20
                             Boron concentration                     Boron concentration
                                   (a)                                     (b)
           Figure 21.3 p ++  etch stop: (a) with KOH concentration as a parameter and (b) with etch temperature for 24% KOH as
           a parameter. Reproduced from Seidel, H. et al. (1990), by permission of Electrochemical Society Inc
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