Page 233 - Sami Franssila Introduction to Microfabrication
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212 Introduction to Microfabrication



                                                         This is possible with a little extra effort in mask
                                                         design by adding compensation structures, shown in
                                                         Figure 21.15.
                                                           The fast etching planes start to erode at convex
                                                         corners. But the final convex corner is protected by
                                                         this sacrificial structure so that after the compensation
                                                         structure has been etched away, a rectangular corner
                                                         remains.
                                                           Timing is the difficult part: if etching is stopped
                                                         too early, a peak remains on the corner. Overetching
                                                         leads to a structure with an undercut corner, similar to
                                                         the non-compensated case but with less undercut. Even
                                                         though this method looks perfect in two dimensions, it
                                                         leaves some small <311> surfaces in three dimensions,
                                                         as seen in Figure 21.8. Another shortcoming of this
                                                         method is that it takes a lot of space to form these
                                                         compensation structures.

            Figure 21.13 Etching through <100> silicon from two  21.9 <110> ETCHING
            sides simultaneously. Reproduced from Nijdam, A.J. et al.
            (1999), by permission of IOP                 Silicon of <110> orientation offers an interesting possi-
                                                         bility to anisotropically wet etch perfectly vertical walls
            cantilevers. Structures already made, resistors, junc-  when the mask is aligned so that slow-etching (111)
            tions, tips, have to be covered during silicon etch-  planes form the sidewalls (Figure 21.16). However, just
            ing, but because etch times are short compared to  as in the case of <100> silicon etching, the relative rates
            backside through-wafer etching, CVD oxide films of  of different crystal planes can be changed by etchant
            standard thickness (<1 µm) can be used as protec-  concentration and temperature. It is possible to find con-
            tive coatings.                               ditions in which square bottom profile can be achieved,
                                                         for instance, KOH (23% wt)-H 2 O-isopropanol (10–15%
                                                                                 ◦
                                                                ◦
                                                         wt) at 85 C or 30% KOH at 70 C.
            21.8 CORNER COMPENSATION                       Under other etch conditions (for instance with 40%
                                                         KOH at 70 C), a self-limiting shape, U-groove, is met
                                                                 ◦
            We noted in Section 21.6 that convex corners are  (Figure 21.17). U-grooves are self-limiting just like V-
            dominated by (311) planes (Figure 21.8). In many  grooves on (100) wafers, when planes that etch slower
            designs, it would be very useful to have sharp corners.  than (110) appear. Etching will proceed until the six



















            Figure 21.14 Cantilever and bridge structures by front-side etching. Underetching from convex corners is used, with
            structures aligned to the [110] main axes on a wafer. Simple rectangular holes along [110] axis result in V-grooves only
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