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8.3  DEMONSTRATOR 6: MICROMIRROR                                    183


               this micromirror, see K¨ uck et al. [209], is a system manufactured using CMOS
               compatible surface micromechanics. It is operated as an actuator, i.e. the mechan-
               ical displacement is not the object of the measurement, but rather the system
               behaviour to be caused. Here the deflection consists of the lowering of the mirror.
               If light falls on the mirror its deflection brings about a corresponding phase shift
               in the reflected light. The picture to be generated finally arises from the resulting
               interferences. The deflection is achieved electrostatically.


               8.3.1    System description


               The micromirror has an edge length of 20 microns and is placed on the chip surface
               in large arrays, e.g. 512 × 464, see Figure 8.17.
                 Each mirror is individually addressable and can be moved independently of the
               others. The mirrors are deflected electrostatically by applying a suitable voltage
               between the mirror and a counter-electrode located below it. The restoring force of
               the suspension works against the electrostatic force, so the mirrors return to their
               initial positions after the voltage is switched off. One problem for modelling is
               that the resulting force depends significantly upon the distance between mirror and
               counter-electrode. In particular there is a positive feedback here, which can lead
               to instabilities.


               8.3.2    Modelling

               Due to the filigree structure of the micromirror, modelling cannot be achieved ana-
               lytically without further complications. The finite element method is particularly
               suited to answering the questions of structural mechanics in such cases. Certain
               questions are essential to the consideration of the interaction between electronics























               Figure 8.17 SEM photo of the micromirror layout (Reproduced by Permission of Fraun-
               hofer-Institut IMS, Duisburg, Germany)
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