Page 112 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
P. 112

MONOLITHIC  PROCESSING    93



                        n-type substrate
       (a)
       Y//////////////L  Grow epitaxy                       Poly deposition  and
                                                            gate  mask


                        Grow  SiO                           Etch  oxide



                        Mask and etch                       Diffuse  p body


                                                            n (arsenic)
                        Implant deep p+                     implant
                        and oxidation

                        Deposit photoresist                 Grow oxide
                        mask and  remove                    and mask
                        photoresist


                        Etch  photoresist               Source
                                                            Etch for  source
                                                            contacts and
                                                            lay source
                                                            metal
                        Strip photoresist




                           Gate oxide



  Figure  4.27  Basic  steps  involved  with  the  fabrication  of  a  vertical  (short-channel)  enhance-
  ment-mode n -channel  power MOSFET

  substrate.  A thick lightly  doped  n  epi-layer  is grown  on the wafer and  from  thereon  the
  steps are shown in Figure  4.27. The vertical configuration produces  low channel  resistance
  and  hence  large  currents  to  flow  through  the  device.  Vertical  power  MOSFETs  are  used
  as  power  drives  in  actuators,  whereas  small-signal  lateral  MOSFETs  are  used  to  amplify
  and  condition  signals  in  sensors.


  4.3.4  Characteristics  of  FETs

  Figure  4.24  shows  the  different  types  of  FETs  that  can  be  fabricated  today.  A  cross
  section  of an n-channel junction  FET  is shown in Figure  4.28  alongside  the  symbols used
  to  denote  the  n-channel  and  p -channel  depletion  types.
   107   108   109   110   111   112   113   114   115   116   117