Page 30 - Principles and Applications of NanoMEMS Physics
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16                                                      Chapter 1


            1.2.1.6 Evaporation

               In this deposition technique, the  evaporant, the  material  one  wants  to
            deposit on the wafer, is heated off a crucible. Heating may be effected by
            resistive means or by direct electron-beam bombardment, Fig. 1-12. In the
            resistive  heating  approach, the wafers  to be coated and the  crucible
            containing the evaporant, are placed inside a vacuum chamber and the latter
            heated until its vapor pressure is greater than that originally existing in the
            chamber.  Evaporation  results in coating everything inside the chamber, in
            particular,  the  wafers of interest.  In the electron-beam bombardment
            approach, line-of-sight coating is obtained.




                                                          Substrate
                                                         Substrate

                                                  B B
                      Vacuum                         e BEAM
                      Vacuum
                                                     e BEAM
                                                            -+
                                                            -+
                                  Evaporant
                                  Evaporant



                       Figure 1-12. Sketch of electron-beam-based evaporation system.

            Typical materials deposited by this technique include Al, Cr, Au, Ni, Fe, Ti,
            Cu, Pt,  FeNi, TiNi, SiW, MgO, SiO 2, Al 2O 3, AlN, SiN. The deposition rate
            is a function of the distance between the evaporant and the substrate, and its
                                              5
                                                 m
            typical maximum thickness is usually ~ µ .

            1.2.2 MEMS Fabrication Methods

               The  creation  of  moveable  structures  necessitates extending the 2-D IC
            fabrication process to include shaping of the third dimension, perpendicular to the
            substrate; this is exemplified, in silicon, by four fundamental techniques, namely,
            Surface Micromachining, Bulk  Micromachining,  Deep Reactive Ion  Etching
            (DRIE), and single crystal silicon reactive etch and metal (SCREAM), which are
            presented next.
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