Page 144 - Rashid, Power Electronics Handbook
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132                                                                                    B. M. Wilamowski




                                 SIT
                                                                       n +                n +              n +
                                                                                     p          p
                                                                              p -                     p -
                                   Schotty                            Drain       Gate  Emitter  Gate      Drain
                                                                                                                     (a)

                          (a)

                                                                       n +                n +              n +
                                                                                    p +   p   p +
                                                                              n -                     n -
                             p    p      p     p    p
                                                                      Drain      Gate  Emitter  Gate      Drain
                                                                                                                    (b)
                                        n -
                                                                    FIGURE 9.13  Structures of the lateral punch-through transistors:
                                                                    (a) simple; and (b) with sharper potential barrier.
                                        n +
                          (b)        anode
                                                                          I  [mA]
                                     cathode                              D
                                                                                         T=298K
                                 p    p    p    p
                                                                                         T=400K
                                                                          2
                                       n -

                                       n +
                          (c)        anode                                                V G =0V
               FIGURE 9.12  Schottky diode with enlarged breakdown voltages: (a)              -2V  -4V
               circuit diagram; and (b) and (c) two cross-sections of possible imple-  1         -6V  -8V
               mentation.                                                                           -10V -12V -14V -16V


                 The quality of the static induction diode can be further
               improved with more sophisticated emitters (Fig. 9.10b,c). The
               SI diode with Schottky emitter was described by Wilamowski                                  [V]
               in 1983 [17] (Fig. 9.12). A similar structure was later described   20      40      60      V DS
               by Baliga [1].
                                                                      FIGURE 9.14  Characteristics of lateral punch-through transistor.

               9.7 Lateral Punch-Through Transistor                 competitor. Such a great improvement of the power-delay
                    (LPTT)                                          product is possible because the SITL structure has a signi®-
                                                                    cantly smaller junction parasitic capacitance and voltage swing
               Fabrications of SI transistors usually require very sophisticated  is reduced. Figures 9.15 and 9.16 illustrate the concept of SITL.
               technology. It is much simpler to fabricate a lateral punch-  Measured characteristics of the n-channel transistor of the
               through transistor, which operates on the same principle and  static induction logic are shown in Fig. 9.17.
               has similar characteristics [15]. The LPTT cross section is
               shown in Fig. 9.13 and its characteristics are shown in Fig.
               9.14.                                                9.9 BJT Saturation Protected by SIT

                                                                    The SI transistor also can be used instead of a Schottky diode
               9.8 Static Induction Transistor Logic                to protect a bipolar junction transistor against saturation [20].
                    (SITL)                                          This leads to faster switching time. The concept is shown in
                                                                    Figs. 9.18 and 9.19. Note that this approach is advantageous to
               The static induction transistor logic (SITL) was proposed by  the solution with Schottky diode because it does not require
               Nishizawa and Wilamowski [8, 9]. This logic circuit has  additional area on a chip and does not introduce additional
                                                                2
               almost 100 times better power-delay product than its I L  capacitance between the base and the collector. The base
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