Page 594 - Instrumentation Reference Book 3E

576 Non-destructive testing

Probe
d Specimen

CRT display
A-scan

c=-----..-
Defect

B-scan

I
Specimen

Probe
movement

Defect I
I
Pian view Recorder display
C-scan (C)
Figure 24.16 A-, B- and C-scan presentations. Courtesy thewelding Institute.

1
\-scan flaw detector I n n
uu I Level
detector B-scan instrument

B-scan screen

Figure 24.17 A- and B-scan equipment. Courtesy thewelding Institute.