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Stacked ICs and Packages (SIP)      113


                    bonded onto PCB, providing the electrical interconnection of stacked chips on PCB
                    pads. Figure 3.38b shows, on the other hand, that chips are first mounted on both
                    surfaces of a lead frame by using TAB and then these lead frames are bonded together,
                    so that the chip stacking structure is finally established.
                       However, the use of TAB technology for chip stacking has been limited due to a
                    variety of concerns that include increased package size with large I/Os, long
                    interconnection lengths, relatively little TAB production infrastructure, and additional
                    wafer processing steps required for bumping to accommodate TAB.

                    3.3.3 Package Stacking
                    While chip stacking provides many advantages such as a small form factor, high
                    performance, and low cost, it has several challenges including lack of chip testability
                    before stacking, lower stacking process yield, and difficulty in integrating dissimilar
                    chips. By employing package stacking technologies, many of these issues can be
                    addressed, as the individual chips are prepackaged, sourced, tested, and yielded
                    separately and then combined once they are known to be good. Package stacking can be
                    realized in many different ways such as package-on-package (PoP), package-in-package
                    (PiP), and folded-stacked chip-scale package (FSCSP).

                    Package-on-Package (PoP)
                    PoP consists of individual packaged dies, in which a top package is stacked directly
                    over an existing package. Figure 3.39 shows one of the earliest versions of PoP stacking.
                    In this example, the PoP interconnections are realized by side terminations, similar to
                    chip stacking. At the sidewall of stacked packages, conductive epoxy is applied in
                    Figure 3.39a [43] and metal traces are formed in Figure 3.39b [44].
                       However, more recent types of PoP stacking structures are more like that shown in
                    Figure 3.40. Stacked packages are connected typically with solder balls providing both
                    clearance and electrical connection. This PoP stacking has been considered a major
                    breakthrough in the package design of mobile applications (Figure 3.41). In a typical
                    PoP, the top package is a multichip package that stacks flash memories and xRAM,
                    while the bottom package is a single-chip package, typically with a logic chip. On the
                    front side of the bottom package, there are land-pads, which are used for electrical
                    communication between the top and bottom packages by mounting the top package on
                    them. The height of the solder balls is adjusted to effectively encompass the logic die
                    and its wire bond loop height.
                       Figure 3.42 shows the variations of PoP stacking. Figure 3.42a demonstrates PoP
                    stacking realized by very short interconnects. Solder balls for package-to-package
                    interconnections are embedded into the substrate, and chip pads are directly connected to
                    substrate traces by electroplating, often referred to as bumpless interconnects [46]. In
                    Figure 3.42b, chips are molded by polymer materials and electric signals are routed through
                    holes in the molding from the front side of the chips to the back side of the molding. These
                    molded packages are then stacked one on top of the other with solder balls, which allow
                    area array interconnection in PoP [47]. Figure 3.42c shows the modernized PoP with side-
                    metallized interconnections. This packaging uses thin flex film as interposers, and Ni-Au
                    metal traces are patterned by laser etching at the sidewall of the stacked package [48].
                       A beneficial feature of the PoP stacking is that each individual package can be tested
                    as a ball grid array (BGA) package before it is stacked. In other words, the known good
                    package is ready for the final assembly, leading to yield improvement. This stacking
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