Page 176 - Microsensors, MEMS and Smart Devices - Gardner Varadhan and Awadelkarim
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156    SILICON  MICROMACHINING:  SURFACE

      must  also have  good  mechanical  properties  to avoid  device  failure during the  fabrication
      process.  These  properties  include  good  adhesion  and  a  low residual  stress  to  eliminate
      device  failure  by  delamination  and/or  cracking.  The  etchants  must  have  excellent  etch
      selectivity  and  must  be  able  to  etch  off  the  sacrificial  materials  without  affecting  the
      structural ones.  In addition, the etchants must also have appropriate viscosity and surface
      tension  characteristics.
        Some  of  the  common  material  systems  that  are  used  in  surface  micromachining  are
      discussed  in  the  following  three  sections,  followed  by  one  worked  example  (a  silicon
      condenser microphone).



      6.3.1  Polycrystalline  Silicon  and Silicon  Dioxide

      This  material  system has already  been  mentioned  in Section  6.1.  The poly-Si/oxide  mate-
      rial  system  is  the  most  common  one  and  uses  the  poly-Si  deposited  by  LPCVD  as  the
      structural  material  and  the  thermally grown  (or  LPCVD)  oxide  as  the  sacrificial  mate-
      rial.  The  oxide  is  readily  dissolved  in  HF  solution  without  the  poly-Si  being  affected.
      Silicon  nitride  is  often  used  together  with  this  material  system  for  electrical  insulation.
      The  advantages of this  material  system include the following:


      1.  Both poly-Si  and  SiO 2  are used in  1C processing;  therefore, their deposition  technolo-
        gies  are readily available.
      2.  Poly-Si  has  excellent  mechanical  properties  and  can  be  doped  for  various  electrical
        applications.  Doping  not  only  modifies  the  electrical  properties  but  can  also  modify
        the  mechanical  properties  of poly-Si.  For example,  the maximum mechanically  sound
        length of a freestanding beam is significantly larger for phosphorus-doped  as compared
                           8
        with  undoped  poly-Si .  However,  in  most  cases,  the  maximum length  attainable  is
        limited  by  the tendency of  the  beam  to  stick to  the substrate.
      3.  The  oxide  can  be  thermally  grown  and  deposited  by  CVD  over  a  wide  range  of
        temperatures  (from  about 200 to  1200°C),  which is very useful  for various  processing
        requirements.  However, the quality of oxide  will  vary with deposition  temperature.
      4.  The  material  system  is  compatible  with  1C processing.  Both  poly-Si  and  SiO 2  are
        standard  materials  for  IC  devices.  This  commonality makes  them highly  desirable  in
        sacrificial  layer technology applications that demand integrated electronics.



      6.3.2  Polyimide  and  Aluminum

      In this second  material  system, the polymer  'polyimide'  is used for the structural  material,
      whereas aluminum is used for the  sacrificial material.  Acid-based  aluminum  etchants are
      used to dissolve the aluminum sacrificial  layer. The three main advantages of this material
      system  are  as  follows:

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       Caution  is needed when  doping because  it can induce a significant  amount  of stress.
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